| 13 |
Yu Jin Choi, Hajin Lim, Suhyeong Lee, Sungin Suh, Joon Rae Kim, Hyung-Suk Jung, Sanghyun Park, Jong Ho Lee, Seong Gyeong Kim, Cheol Seong Hwang*, and HyeongJoon Kim* Improving the electrical properties of Lanthanum Silicate films on Ge metal oxide semiconductor capacitors by adopting interfacial barrier and capping layers ACS Applied Materials and Interfaces, 10, 6, 7885-7894 (2014) |
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| 12 |
Donghee Son, Jongha Lee, Shutao Qiao, Roozbeh Ghaffari, Jaemin Kim, Ji Eun Lee, Changyeong Song, Seok Joo Kim, Dong Jun Lee, Samuel Woojoo Jun, Shixuan Yang, Minjoon Park, Jiho Shin, Kyungsik Do, Mincheol Lee, Kwanghun Kang, Cheol Seong Hwang, Nanshu Lu, Taeghwan Hyeon and Dae-Hyeong Kim Multifunctional wearable devices for diagnosis and therapy of movement disorders Nature Nanotechnology, 9, 397-404 (2014) |
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| 11 |
Sang Young Lee, Hyo Kyeom Kim, Jong Ho Lee, Il-Hyuk Yu, Jae-Ho Lee, and Cheol Seong Hwang Effects of O3 and H2O as oxygen sources on the atomic layer deposition of HfO2 gate dielectrics at different deposition temperatures Journal of Materials Chemistry C, 2, 2558-2568 (2014) |
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| 10 |
Katsuhisa Murakami, Mathias Rommel, Boris Hudec, Alica Rosová, Kristina Hušeková, Edmund Dobročka, Raul Rammula, Aarne Kasikov, Jeong Hwan Han, Woongkyu Lee,Seul Ji Song, Albena Paskaleva, Anton J. Bauer, Lothar Frey, Karol Fröhlich, Jaan Aarik, and Cheol Seong Hwang Nanoscale Characterization of TiO2 Films Grown by Atomic Layer Deposition on RuO2 Electrodes Applied Materials and Interfaces, 4, 6, 2486-2492 (2014) |
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| 9 |
Min Hyuk Park, Han Joon Kim, Yu Jin Kim, Woojin Jeon, Taehwan Moon and Cheol Seong Hwang Ferroelectric properties and switching endurance of Hf0.5Zr0.5O2 films on TiN bottom and TiN or RuO2 top electrodes Physica Status Solidi R.R.L., 6, 8, 532-535 (2014) |
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| 8 |
Min Hyuk Park, Han Joon Kim, Yu Jin Kim, Taehwan Moon and Cheol Seong Hwang The effects of crystallographic orientation and strain of thin Hf0.5Zr0.5O2 film on its ferroelectricity Applied Physics Letters, 104, 072901 (2014) |
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| 7 |
Jeong Hwan Kim, Tae Joo Park, Seong Keun Kim, Deok-Yong Cho, Hyung-Suk Jung, Sang Young Lee, Cheol Seong Hwang Chemical structures and electrical properties of atomic layer deposited HfO2 thin films grown at an extremely low temperature(≤100oC) using O3 as an oxygen source Applied Surface Science, 15, 852-856 (2014) |
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| 6 |
Taeyong Eom, Taehong Gwon, Sijung Yoo, Byung Joon Choi, Moo-Sung Kim, Iain Buchanan, Manchao Xiao, and Cheol Seong Hwang Influence of the Kinetic Adsorption Process on the Atomic Layer Deposition Process of (GeTe2)(1–x)(Sb2Te3)x Layers Using Ge4+–Alkoxide Precursors Chemistry of Materials, 4, 26, 1583-1591 (2014) |
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| 5 |
Seo Hyoung Chang, Jungho Kim*, Charudatta Phatak, Kenneth D’Aquila, Seong Keun Kim, Jiyoon Kim, Seul Ji Song, Cheol Seong Hwang, Jeffrey A. Eastman, John W. Freeland, and Seungbum Hong* X‑ray Irradiation Induced Reversible Resistance Change in Pt/TiO2/Pt Cells ACS Nano, 2, 8, 1584-1589 (2014) |
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| 4 |
Jae Ho Lee, Il-Hyuk Yu, Sang Young Lee, and Cheol Seong Hwang Phase control of HfO2-based dielectric films for higher-k materials Journal of Vacuum Science & Technology B, 3, 32, 03D109 (2014) |
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| 3 |
Bong Seob Yang, Seungha Oh, Yoon Jang Kim, Sang Jin Han, Hong Woo Lee, Hyuk Jin Kim, Hui Kyung Park, Jae Kyeong Jeong, Jaeyeong Heo, Cheol Seong Hwang and Hyeong Joon Kim Effect of sputter power on the photobias stability of zinc-tin-oxide field-effect transistors Journal of Vacuum Science & Technology B, 1, 32, 011202 (2014) |
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| 2 |
Hasung Sim, Seongil Choi, Je-Geun Park, Jaewon Song, Seungwu Han, Cheol Seong Hwang, and Deok-Yong Cho Low Temperature Measurement of the Electrical Conductivity in Amorphous InGaZnO Thin Films ECS Journal of Solid State Science and Technology, 2, 3, 10-12 (2014) |
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| 1 |
Kyung Jean Yoon, Seul Ji Song, Jun Yeong Seok, Jung Ho Yoon, Tae Hyung Park,Dae Eun Kwon and Cheol Seong Hwang Evolution of the shape of the conducting channel in complementary resistive switching transition metal oxides Nanoscale, 6, 2161-2169 (2014) |
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