| 23 |
Seul Ji Song, Kyung Min Kim, Gun Hwan Kim, Jun Yeong Seok, Ranju Jung and Cheol Seong Hwang Effect of Capacitive Charge on the Set-state Resistance in TiO2 Unipolar Resistance Switching Memory MRS spring meeting 2010, San Francisco Marriott, April 7 (2010), Poster
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| 22 |
Min Hyuk Park, Hyun Ju Lee and Cheol Seong Hwang Ferroelectric Properties of Pt/Pb(Zr, Ti)O3/Al2O3/ZnO/Pt Stack Capacitors for Nonvolatile Memory Applications MRS spring meeting 2010, San Francisco Marriott, April 8 (2010), Oral
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| 21 |
HyunJu Lee, Gun Hwan Kim, Min Hyuk Park and Cheol Seong Hwang Polarization Reversal in the Pt/Pb(Zr,Ti)O3/Pt and Pt/Al2O3/Pb(Zr,Ti)O3/Pt Ferroelectric Capacitors MRS spring meeting 2010, San Francisco Marriott, April 7 (2010), Oral
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| 20 |
An Quan Jiang, Hyun Ju Lee, Gun Hwan Kim, Min Hyuk Park and Cheol Seong Hwang Inlaid Al2O3 Tunnel Switch Layer for Improving the Ferroelectric Performance of the Ultra-thin Pb(Zr,Ti)O3 Thin Films MRS spring meeting 2010, San Francisco Marriott, April 7 (2010), Oral
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| 19 |
Kyung Min Kim, Duk Hwang Kwon, Jae Hyuck Jang, Jong Myeong Jeon, Min Hwan Lee, Seul Jie Song, Gun Hwan Kim, Jun Yeong Seok, Bora Lee, Seungwu Han, Miyoung Kim and Cheol Seong Hwang Microscopic Identity of the Conducting Filaments and Resistance Switching Mechanism in TiO2 Thin Film MRS spring meeting 2010, San Francisco Marriott, April 7 (2010)
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| 18 |
Kyung Min Kim, Seul Ji Song, Gun Hwan Kim, Joon Young Seok and Cheol Seong Hwang Improved Resistance Switching Behavior of n-type TiO2/p-type NiO Stacked Structure MRS spring meeting 2010, San Francisco Marriott, April 7 (2010), Oral
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| 17 |
Minhwan Lee, Kyung Min Kim, Jung Ho Yoon and Cheol Seong Hwang Impedance Spectroscopy Observation for Examining Resistive Switching Mechanism in TiO2 Thin Films MRS spring meeting 2010, San Francisco Marriott, April 7 (2010), Oral
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| 16 |
H.S. Jung, H. K. Kim, J.H. Kim, S. Y. Lee, J. Lee, J.M.Park, W.H.Kim, M.W.Song, N.I.Lee, and C.S. Hwang Bias temperature instability characteristics of HfO2 and HfOxNy 제 17회 한국 반도체 학술대회, 호텔 인터불고 엑스코, February 24~26 (2010), Oral
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| 15 |
J.H.Kim, U.K.Kim, H.C. Oh, and C.S. Hwang The effect of NH3 annealing on electrical property and Hydration related degradation of the bottom gate TFT with ZnO channel layer 제 17회 한국 반도체 학술대회, 호텔 인터불고 엑스코, February 24~26 (2010), Oral
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| 14 |
M. Seo, S.K. Kim, and C. S. Hwang Structural study of HfO2/TiO2 stacked films grown by atomic layer deposition 제 17회 한국 반도체 학술대회, 호텔 인터불고 엑스코, February 24~26 (2010), Poster
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