| 39 |
Jeong Hwan Han, Woongkyu Lee, Sora Han, Cheol Seong Hwang Deposition of Ru based electrodes using CVD/ALD for MIM capacitor of next generation DRAM device EuroCVD 18, Kinsle, Co. Cork, Ireland, sept. 4~9 (2011), Oral |
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| 38 |
Sang Ho Rha, Yoon Soo Jung, Jisim Jung, Un Ki Kim, Yoon Jang Chung and Cheol Seong Hwang The Influence of the Contact Geometry between Metal Electrodes and Amorphous-Indium-Gallium-Zinc Oxide (a-IGZO) on Electrical Performance 2011 MRS Fall Meeting & Exhibit, Boston, Nov. 28 - Dec. 2 (2011), Oral |
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| 37 |
Jisim Jung, Sang Ho Rha, Yoon Soo Jung, Un Ki Kim, Yoon Jang Chung and Cheol Seong Hwang Study on the Charge Trapping Characteristics in Bottom-Gate InGaZnO Thin Film Transistors with Al2O3/SiO2 Gate Dielectrics 2011 MRS Fall Meeting & Exhibit, Boston, Nov. 28 - Dec. 2 (2011), Oral |
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| 36 |
Sang Ho Rha, Jisim Jung, Yoon Soo Jung, Un Ki Kim, Yoon Jang Chung and Cheol Seong Hwang Simulations on the Electrical Properties of Amorphous Oxide Semiconductor Thin Film Transistors Considering Localized Trap Distribution Based on the Pao-Sah Model 2011 MRS Fall Meeting & Exhibit, Boston, Nov. 28 - Dec. 2 (2011), Poster |
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| 35 |
Gun Hwan Kim, Jong Ho Lee, Jeong Hwan Han, Seul Ji Song, Jun Yeong Seok,Jung Ho Yoon, Kyung Jean Yoon, Min Hwan Lee, Tae Joo Park, and Cheol Seong Hwang Cross-bar resistive memory using TiO2 thin film 42nd IEEE Semiconductor Interface Specialists Conference, Arlington, Dec. 1-3 (2011) |
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| 34 |
Hyo Kyeom Kim, Hyung-Suk Jung, Sang Young Lee, Il-Hyuk Yu, Tae Joo Park, Cheol Seong Hwang Comparison of modulation behaviors of flat band voltage and work function in TiN/HfO2/La gate stack on Si and Ge 42nd IEEE Semiconductor Interface Specialists Conference, Arlington, Dec. 1-3 (2011), Oral |
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| 33 |
Hyung-Suk Jung, Hyo Kyeom Kim, Sang Young Lee, and Nae-in Lee, Tae Joo Park, Cheol Seong Hwang Thermally robust atomic layer deposited ZrO2 gate dielectric films upon the post-deposition annealing The Solid-State Device Research Conference ESSDERC, Helsinki, Finland, Sept. 12-16 (2011), Oral |
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| 32 |
Seul Ji Song, Jun Yeong Seok, Kyung Min Kim, Gun Hwan Kim, Min Hwan Lee, Jung Ho Yoon and Cheol Seong Hwang Kinetic study on the formation and rupture of conducting nano-filaments in RRAM International Symposium on Integrated Functionalities(ISIF) 2011, Cambridge, July 31 - August 4 (2011) |
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| 31 |
Yu Jin Kim, Hyun Ju Lee, Min Hyuk Park, An Quan Jiang, and Cheol Seong Hwang The tunnel switching behavior in SiO2/Pb(Zr,Ti)O3 Bi-layer Capacitors ISAF-PFM-2011, Vancouver, July 24-27 (2011), Poster |
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| 30 |
Hyung-Suk Jung, Il-Hyuk Yu, Hyo Kyeom Kim, Sang Young Lee, Nae-In Lee, Tae Joo Park, and Cheol Seong Hwang Effects of passivation layers and deposition temperature on electrical properties of atomic layer deposited HfO2 on Ge substrate 42nd IEEE Semiconductor Interface Specialists Conference, Arlington, Dec. 1-3 (2011), Poster |
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