| 4 |
Jun Shik Kim, Sukin Kang, Younjin Jang, Yonghee Lee, Kwangmin Kim, Whayoung Kim, Woongkyu Lee, and Cheol Seong Hwang Investigating the Reasons for the Difficult Erase Operation of a Charge-Trap Flash Memory Device with Amorphous Oxide Semiconductor Thin-Film Channel Layers physica status solidi (RRL)–Rapid Research Letters, DOI: 10.1002/pssr.202000549 |
 |
 |
| 2 |
Dong Gun Kim, Dae Seon Kwon, Junil Lim, Haengha Seo, Tae Kyun Kim, Woongkyu Lee and Cheol Seong Hwang Trap Reduction through O3 Post‐Deposition Treatment of Y2O3 Thin Films Grown by Atomic Layer Deposition on Ge Substrates Advanced Electronic Materials, 202000819 (2021) |
 |
 |
| 1 |
Dong Gun Kim, Cheol Hyun An, Sanghyeon Kim, Dae Seon Kwon, Junil Lim, Woojin Jeon and Cheol Seong Hwang Optimized Al-doped TiO2 gate insulator for metal-oxide-semiconductor capacitor on Ge substrate Journal of Materials Chemistry C, 9, 1572-1583 (2021) |
 |
 |