28 |
Woo Chul Lee, Cheol Jin Cho, Sangtae Kim, Eric S. Larsen, Jung Hwan Yum , Christopher W. Bielawski, Cheol Seong Hwang, and Seong Keun Kim Growth and Characterization of BeO Thin Films Grown by Atomic Layer Deposition Using H 2 O and O 3 as Oxygen Sources Á¦25ȸ Çѱ¹¹ÝµµÃ¼Çмú´ëȸ, °¿øµµ ÇÏÀÌ¿ø¸®Á¶Æ®, 2018³â 2¿ù 5ÀÏ~7ÀÏ, Oral |
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27 |
In Hwan Beak, Jung Joon Pyeon, Taek Mo Chung, Jeong Hwan Han, Choel Seong Hwang and Seong Keun Kim Synthesis of 2D SnS Thin films and their potential applications Á¦ 25ȸ Çѱ¹¹ÝµµÃ¼Çмú´ëȸ, °¿øµµ ÇÏÀÌ¿ø¸®Á¶Æ®, 2018³â 2¿ù 5ÀÏ~7ÀÏ, Oral |
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26 |
Eun Suk Hwang, Jun Shik Kim, Seok Min Jeon, Seungjun Lee, Younjin Jang, and Cheol Seong Hwang Oxide Semiconductor-Based Charge Trap Device for NAND Flash Memory Á¦25ȸ Çѱ¹¹ÝµµÃ¼Çмú´ëȸ, °¿ø ÇÏÀÌ¿ø¸®Á¶Æ®, 2018³â 2¿ù 5ÀÏ ~ 7ÀÏ, Poster
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25 |
Seungjun Lee, Younjin Jang, Eun Suk Hwang, Jun Shik Kim, Seok Min Jeon, and Cheol Seong Hwang Characterizations of P-Type Tin Monoxide Thin Films Deposited by a Co-Sputtering Process Á¦25ȸ Çѱ¹¹ÝµµÃ¼Çмú´ëȸ, °¿ø ÇÏÀÌ¿ø¸®Á¶Æ®, 2018³â 2¿ù 5ÀÏ ~ 7ÀÏ, Poster
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24 |
Jun Shik Kim, Eun Suk Hwang, Seungjun Lee, Younjin Jang, Seok Min Jeon, and Cheol Seong Hwang Zinc Tin Oxide Thin Films Grown by Atomic Layer Deposition for Charge-Trap Flash Memory Á¦25ȸ Çѱ¹¹ÝµµÃ¼Çмú´ëȸ, °¿ø ÇÏÀÌ¿ø¸®Á¶Æ®, 2018³â 2¿ù 5ÀÏ ~ 7ÀÏ, Poster
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23 |
Younjin Jang, Jun Shik Kim, Eun Suk Hwang, Seungjun Lee, Seok Min Jeon, Jeong Hwan Han, and Cheol Seong Hwang Hysteric Transfer Characteristics of P-Type Thin Film Transistors with SnO Thin Films Grown by Atomic Layer Deposition
Á¦25ȸ Çѱ¹¹ÝµµÃ¼Çмú´ëȸ, °¿ø ÇÏÀÌ¿ø¸®Á¶Æ®, 2018³â 2¿ù 5ÀÏ ~ 7ÀÏ, Poster
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22 |
Seung Dam Hyun, Hyeon Woo Park, Yu Jin Kim, Min Hyuk Park, Young Hwan Lee, Han Joon Kim, Young Jae Kwon, Taehwan Moon, Keum Do Kim, Yong Bin Lee, Beak Su Kim and Cheol Seong Hwang Dispersion in ferroelectric switching performance of polycrystalline Hf 0.5 Zr 0.5 O 2 thin films Á¦25ȸ Çѱ¹¹ÝµµÃ¼Çмú´ëȸ, °¿ø ÇÏÀÌ¿ø¸®Á¶Æ®, 2018³â 2¿ù 5ÀÏ ~ 7ÀÏ, Oral |
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21 |
Liu Kai, Eunjung Ko, Cheol Seong Hwang, and Jung-Hae Choi Atomic structure and electronic properties of Ge nanowires along [100], [110] and [111] directions; Density Functional StudyÁ¦25ȸ Çѱ¹¹ÝµµÃ¼Çмú´ëȸ, °¿ø ÇÏÀÌ¿ø¸®Á¶Æ®, 2018³â 2¿ù 5ÀÏ ~ 7ÀÏ, Oral |
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20 |
Hyeon Woo Park, Yujin Kim, Seung Dam Hyun, Han Joon Kim, Keum Do Kim, Young Hwan Lee, Taehwan Moon, Yong Bin Lee, Min Hyuk Park, Jang Ho Noh, and Cheol Seong Hwang Comparative study on models of the voltage drop phenomena in ferroelectric thin films High-k oxides by ALD, Poland, March 7-10 (2018), Poster
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19 |
Young Hwan Lee, Min Hyuk Park, Han Joon Kim, Taehwan Moon, Keum Do Kim, Seung Dam Hyun, Hyeon Woo Park, Yong Bin Lee, Baek Soo Kim, and Cheol Seong Hwang Effective phase transformation kinetics of ferroelectric Hf0.5Zr0.5O2 films by the presence of the top electrode High-k oxides by ALD, Poland, March 7-10 (2018), Poster |
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