H. J. Kim, M. H. Park, Y. J. Kim, T. Moon, K. D. Kim, W. Jeon, T. Gwon and C. S. Hwang

Incorporation of Al₂O₃ inter-layer to ferroelectric Hf_0.5Zr_0.5O₂ films for controlling grain size and leakage current

14th Annual Non-Volatile Memory Technology Symposium, Jeju, Korea, October 27-29 (2014), poster

Cheol Jin Cho, Min-Jung Choi, Jin-Sang Kim, Cheol Seong Hwang, and Seong Keun Kim

High dielectric Al-doped TiO₂ films grown by Atomic Layer Deposition

14th Annual Non-Volatile Memory Technology Symposium, Jeju, Korea, October 27-29 (2014), poster

J. H. Yoon, S. J. Song, I. Yoo, S. Yoo, J. Y. Seok, K. J. Yoon, D. E. Kwon, T. H. Park, Y. J. Kwon, and C. S. Hwang

Highly Uniform, Electroforming-free, and Self-rectifying Resistive Memory in the Pt/Ta₂O₅/HfO_2-x/TiN and Pt/Ta₂O₅/HfO_2-x/Ti Structure

14th Annual Non-Volatile Memory Technology Symposium, Jeju, Korea, October 27-29 (2014)

Taehong Gwon, Taeyong Eom, Sijung Yoo, Moo-Sung Kim, Iain Buchanan, Manchao Xiao, and Cheol Seong Hwang

New chemical methods for GeTe deposition for phase change memory application

14th Annual Non-Volatile Memory Technology Symposium, Jeju, Korea, October 27-29 (2014), poster

D. E. Kwon, J. H. Yoon, S. J. Song, J. Y. Seok, K. J. Yoon, T. H. Park, Y. J. Kwon, and Cheol Seong Hwang

Resistive Switching Property of SiN_x thin film

14th Annual Non-Volatile Memory Technology Symposium, Jeju, Korea, October 27-29 (2014), poster

Taeyong Eom, Taehong Gwon, Sijung Yoo, Byung Joon Choi, Moo-Sung Kim, Iain Buchanan, Manchao Xiao, and Cheol Seong Hwang

Conformal formation of (GeTe₂)_(1-x)[Sb_(1-y)Te_y]_x thin film for phase change memories application

14th Annual Non-Volatile Memory Technology Symposium, Jeju, Korea, October 27-29 (2014), poster

Jung Ho Yoon and Cheol Seong Hwang

Self-rectifying resistance switching materials for cross-bar array

15th IUMRS-ICA, Fukuoka, Japan, Aug 24-30 (2014)

Cheol Seong Hwang and Min Hyuk Park

HfO₂-based Ferroelectric Thin Films

JKCFE 10, Hiroshima, Japan, Aug 17-20 (2014)

Seul Ji Song, Jun Yeong Seok, Jung Ho Yoon, Byung Joon Choi, and Cheol Seong Hwang

Real-time identification of the evolution of conducting nano-filaments in TiO₂ thin film ReRAM

ISCAS, melbourne, australia, June 01-05 (2014), lecture