Á¦ÀÛȸ»ç : PANalytical ¸ðµ¨¸í : X¡¯Pert PRO MPD ¿ëµµ : X-ray Diffraction, Reflection Ư¡ : -Incident beam monochromator, offering pure K¥á1 radiation. -Quick change optics allows for rapid experimental change-over -Incident beam optics ¤ýProgrammable divergence slit ¤ýParabolic multilayer mirror (Cu radiation) -Diffracted beam optics ¤ýProgrammable receiving slit ¤ýRadial divergence limiting slits (also known as: thin film attachment, parallel plate collimator, long Soller slits) -Detectors ¤ýHigh count rate (500k c/s) proportional detector with curved diffraction side graphite monochromators for precision measurements with Cu radiation ¤ýPosition sensitive detector for high speed measurements ´ã´çÀÚ : ÇÑÀå¿í, ±è¿µ·Ï
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