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Total Papers : 802 Total Conferences : 1140 Total Patents : 191

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2026 (69)
2025 (22)
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2021 (25)
2020 (22)
2019 (32)
2018 (58)
2017 (41)
2016 (48)
2015 (49)
2014 (51)
2013 (31)
2012 (55)
2011 (39)
2010 (53)
2009 (40)
2008 (46)
2007 (25)
2006 (36)
2005 (43)
2004 (51)
2003 (32)
2002 (20)
2001 (32)
2000 (18)
1999 (8)
1998 (0)
1997 (0)
Invited (100)


11	Yeon Woo Yoo, Woojin Jeon, Woongkyu Lee and Cheol Seong Hwang Study on atomic layer deposition behavior of TiO₂ films on SiO₂ and RuO₂ substrates with different growth temperatures 제 20회 한국 반도체 학술대회, 성우리조트, 2013년 2월 4일-6일, poster
10	Kyung Jean Yoon, Seul Ji Song, Jun Yeong Seok, Jung Ho Yoon, Jong Ho Lee, and Cheol Seong Hwang Variation in the bipolar resistive switching behavior according to the former unipolar resistive switching reset in a Pt/TiO₂/Pt 제 20회 한국 반도체 학술대회, 성우리조트, 2013년 2월 4일-6일, Poster
9	Min Hyuk Park, Han Joon Kim, Yu Jin Kim, Hyo Kyeom Kim, Woongkyu Lee, Il-Hyuk Yu, and Cheol Seong Hwang The effects of grain size on the electrical properties of ferroelectric Hf_1-xZr_xO₂ thin films 제 20회 한국 반도체 학술대회, 성우리조트, 2013년 2월 4일-6일, Oral
8	Un Ki Kim, Sang Ho Rha, Jeong Hwan Kim, Yoon Jang Chung, Jisim Jung, Eun Suk Hwang, Tae Joo Park, and Cheol Seong Hwang Different negative bias illumination stabilities according to the Zn/Sn atomic compositions in zinc tin oxide thin film transistors 제 20회 한국 반도체 학술대회, 성우리조트, 2013년 2월 4일-6일, Oral
7	Jun Yeong Seok, Gun Hwan Kim, Seul Ji Song, Jung Ho Yoon, Kyung Jean Yoon and Cheol Seong Hwang Resistive switching phenomena in binary oxide thin films with semiconducting In₂Ga₂ZnO₇ electrode 제 20회 한국 반도체 학술대회, 성우리조트, 2013년 2월 4일-6일, Poster
6	김유진, 박민혁, 정형석, 김한준, 황철성 The observation of Negative Capacitance at Room Temperature from Switching Domains of Ferroelectric Thin Films 제 20회 한국 반도체 학술대회, 성우리조트, 2013년 2월 4일-6일, Oral
5	Jung Ho Yoon, Seul Ji Song, Jun Yeong Seok, Kyung Jean Yoon, Jong Ho Lee and Cheol Seong Hwang Self-rectifying resistive switching behavior in bi-layer structure based on HfO₂ thin film 제 20회 한국 반도체 학술대회, 성우리조트, 2013년 2월 4일-6일, Poster
4	Han Joon Kim, Min Hyuk Park, Yu Jin Kim, Hyo Kyeom Kim, Il-Hyuk Yu, and Cheol Seong Hwang Examination on the ferroelectric properties and reliability of Hf_xZr_1-xO₂ films on Ir substrates 제 20회 한국 반도체 학술대회, 성우리조트, 2013년 2월 4일-6일, Poster
3	Woojin Jeon, Woongkyu Lee, Yeon Woo Yoo, and Cheol Seong Hwang EOT Scaling under 4.0Å with TiO₂ and Al-doped TiO₂ Film 제 20회 한국 반도체 학술대회, 성우리조트, 2013년 2월 4일-6일, Oral
2	Taeyong Eom, Taehong Gwon, Sijung Yoo, Seol Choi, Byung Joon Choi, Moo-sung Kim, Iain Buchanan, Manchao Xiao, and Cheol Seong Hwang Atomic layer deposition characteristics of (GeTe₂)_(1-x)(Sb₂Te₃)_x layers for Phase change memories 제 20회 한국 반도체 학술대회, 성우리조트, 2013년 2월 4일-6일, Oral


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