| 19 |
Woongkyu Lee, Sang Woon Lee, Jeong Hwan Han, Sora Han, Julien Gatineau and Cheol Seong Hwang Controlling initial growth behavior of ALD-SrTiO3 films Using the interposed ALD-Al2O3 layers ALD 2011, Cambridge, June 26~29 (2011), Poster |
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| 18 |
Joohwi Lee, Seung-Cheol Lee, Cheol Seong Hwang and Jung-Hae Choi Ab-initio phonon calculations on the various ZnSnO phases 7th KIAS electronic structure calculation workshop, KIAS, June 23-24 (2011), Poster |
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| 17 |
Sae-Jin Kim, Joohwi Lee, Seung-Cheol Lee, Cheol Seong Hwang, Chan Park and Jung-Hae Choi Ab-initio calculations on the energy barrier of nitrogen diffusion in hexagonal Ge2Sb2Te5 Korean Ceramic Society Spring meetings, Gyonggi University, April 21-22 (2011) |
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| 16 |
Joohwi Lee, Seung-Cheol Lee, Cheol Seong Hwang and Jung-Hae Choi First-principles phonon calculations on the various zinc tin oxide phases Korean Ceramic Society Spring meetings, Gyonggi University, April 21-22 (2011) |
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| 15 |
Y. J. Chung, J. H. Kim, U. K. Kim, D. –Y. Cho, and C. S. Hwang Hole trapping as the mechanism for negative bias-illumination stress instability in amorphous oxide semiconductors ITC 2011 Cambridge, Clare College, Cambridge, UK, March 3-4 (2011), Poster |
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| 14 |
Un Ki Kim, Jeong Hwan Kim, Yoon Jang Chung, and Cheol Seong Hwang The Effect of Composition Change on the Negative Bias Illumination Temperature Stability in Zinc Tin Oxide Thin Film Transistors ITC 2011 Cambridge, Clare College, Cambridge, UK, March 3-4 (2011), Poster |
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| 13 |
Min Hyuk Park, Hyun Ju Lee, Yu Jin Kim, and Cheol Seong Hwang Novel Diode-Embedded Ferroelectric Resistive Memory Using Pt/Pb(Zr,Ti)O3/Al2O3/TiOx/Pt stack capacitor 제 7차 강유전체연합심포지엄, 무주리조트, 2011년 2월 13일-15일, Poster |
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| 12 |
Un Ki Kim, Jeong Hwan Kim, Him Chan Oh, Yoon Jang Chung, and Cheol Seong Hwang The Effect of Illumination on the Negative Bias Temperature Instability in Zinc Tin Oxide Thin Film Transistors 제 18회 한국 반도체 학술대회, 해비치 호텔 & 리조트 제주, 2011년 2월 16일-18일, Poster |
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| 11 |
김정환, 김언기, 정윤장, 정지심, 라상호, 정형석, 정재경, 이상윤, 황철성 The effects of device geometry on the negative bias temperature instability of amorphous Hf-In-Zn-O thin film transistors under light illumination 제 18회 한국 반도체 학술대회, 해비치 호텔 & 리조트 제주, 2011년 2월 16일-18일, Poster |
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| 10 |
Gun Hwan Kim, Kyung Min Kim, Jun yeong Seok, Seul Ji Song, Jung Ho Yoon, and Cheol Seong Hwang Electrical endurance characteristic and conductive-atomic force microscopy study of resistance switching cross bar array structure 제 18회 한국 반도체 학술대회, 해비치 호텔 & 리조트 제주, 2011년 2월 16일-18일, Poster |
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