43 |
B. J. Choi, D. S. Jung, S. K. Kim, S. Choi, J. H. Oh, C. Rohde, H. J. Kim, C. S. Hwang, R. Waser, B. Reichenberg, S. Tiedke Resistive switching mechanism of TiO2 thin films grown by atomic-layer-deposition Juelich Nanoelectronics Days, Juelich, Germany, February 9-12 (2005) |
 |
42 |
Cheol Seong Hwang and Doo Seok Jeong Current transport mechanism through high-k HfO2 films on Si 17th International Symposium on Integrated Ferroelectrics, Shanghai, China, April 17-20 (2005) |
 |
41 |
Cheol Seong Hwang, Woo Young Park, Choong Bae Joen, Mathias Schindler, and Doo Seok Jeong Film thickness dependent dielectric properties and Curie-Weiss behavior of (Ba,Sr)TiO3 thin film capacitors 2nd International conference on electroceramics., KIST, Korea, Junary 13 (2005) |
 |
40 |
Cheol Seong Hwang Resistive switching in TiO2 thin films Japan-Korea special symposium on ¡°Evolution and Outlook of Oxide Nonvolatile memories¡±, Nihon Univ. Tokyo, Japan, December 11 (2005) |
 |
39 |
Hyun Ju Lee, Jin Shi Zhao, Joon Seop Sim, Dong Yeon Park and Cheol Seong Hwang Characterization of PbxPty alloy formation during deposition of Pb(Zr,Ti)O3 thin films by liquid delivery metal-organic chemical vapor deposition 2005 MRS fall meeting, Hynes Convention Center & Sheraton Boston Hotel, Boston, MA, November 28-December 2 (2005) |
 |
38 |
Joon Seop Sim, Jin Shi Zhao, Hyun Ju Lee, Woo Young Park and Cheol Seong Hwang Growth characteristics of metal-organic chemical vapor deposited Pb(Zr,Ti)O3 fimls ono SrRuO3 electrodes 2005 MRS fall meeting, Hynes Convention Center & Sheraton Boston Hotel, Boston, MA, November 28-December 2 (2005) |
 |
37 |
Tae Joo Park, Seong Keun Kim, Jeong Hwan Kim, Jaehoo Park, Moonju Cho, Suk Woo Lee, Sug Hun Hong, and Cheol Seong Hwang Electrical properties of high-k HfO2 films on Si1-xGex substrates 14th bi-annual conference on Insulating Films on Semiconductors (INFOS 2005), IMEC, Belgium, June 22-23 (2005) |
 |
36 |
Sun Hee Choi, Woo Sik Kim, Ji-Won Son, Jong-Ho Lee, Hae-Weon Lee Cheol Seong Hwang and Joosun Kim Fabrication and Characterization of the Thin Film Electrolyte for Integrated On-plane Type Micro-SOFCs Second International Conference on Flow Dynamics, Sendai, Japan, November 16-18 (2005) |
 |
35 |
S. K. Kim, K. M. Kim, C. S. Hwang Atomic layer deposition of titanium oxide thin films using O3 for MIM capacitor of next generation memory devices AVS 52nd International Symposium & Exhibition, Hynes convention center, Boston, MA, USA, October 30-November 4 (2005) |
 |
34 |
O. S. Kwon, S. W. Lee, C. S. Hwang Atomic layer deposition of SrTiO3 films having a high thickness- and cation-composition confirmality over a severe contact hole structure AVS 52nd International Symposium & Exhibition, Hynes convention center, Boston, MA, USA, October 30-November 4 (2005) |
 |