HOME > Publication > Paper

Paper

Total Papers : 714         Total Conferences : 1012

Citation Information supported by Google Scholar


7

Hao Jiang, Xiang Yuan Li, Ran Chen, Xing Long Shao, Jung Ho Yoon, Xiwen Hu, Cheol Seong Hwang*, and Jinshi Zhao*

Bias-polarity-dependent resistance switching in W/SiO2/Pt and W/SiO2/Si/Pt structures

Scientific Reports, 6, 22216 (2016)


6

Seul Ji Song¢Ó, Yu Jin Kim¢Ó, Min Hyuk Park, Young Hwan Lee, Han Joon Kim, Taehwan Moon, Keum Do Kim, Jung-Hae Choi, Zhihui Chen, Anquan Jiang and Cheol Seong Hwang

Alternative interpretations for decreasing voltage with increasing charge in ferroelectric capacitors

Scientific Reports, 6, 20825 (2016)


5

Woongkyu Lee, Sijung Yoo, Kyung Jean Yoon, In Won Yeu, Hye Jung Chang, Jung-Hae Choi, Susanne Hoffmann-Eifert, Rainer Waser, and Cheol Seong Hwang

Resistance switching behavior of atomic layer deposited SrTiO3 film through possible formation of Sr2Ti6O13 or Sr1Ti11O20 phases

Scientific Reports, 6, 20550 (2016)


4

Yu Jin Kim, Min Hyuk Park, Young Hwan Lee, Han Joon Kim, Woojin Jeon, Taehwan Moon, Keum Do Kim, Doo Seok Jeong, Hiroyuki Yamada and Cheol Seong Hwang

Frustration of Negative Capacitance in Al2O3/BaTiO3 Bilayer Structure

Scientific Reports, 6, 19039 (2016)


3

Tae Jun Seok¢Ó, Young Jin Cho¢Ó, Hyun Soo Jin, Dae Hyun Kim, Dae Woong Kim, Sang-Moon Lee, Jong-Bong Park, Jung-Yeon Won, Seong Keun Kim, Cheol Seong Hwang* and Tae Joo Park*

High quality interfacial sulfur passivation via H2S pre-deposition annealing for atomic-layer-deposited HfO2 film on Ge substrate

Journal of Material Chemistry C, 4, 850-856 (2016)


2

Min Hyuk Park¢Ó, Han Joon Kim¢Ó, Young Hwan Lee, Yu Jin Kim, Taehwan Moon, Keum Do Kim, Seung Dam Hyun and Cheol Seong Hwang

Two-step polarization switching mediated by a nonpolar intermediate phase in Hf0.4Zr0.6O2 thin films

Nanoscale, 8, 13898-13907 (2016)


1

Han Joon Kim, Min Hyuk Park, Yu Jin Kim, Young Hwan Lee, Taehwan Moon, Keum Do Kim, Seung Dam Hyun and Cheol Seong Hwang

A study on the wake-up effect of ferroelectric Hf0.5Zr0.5O2 films by pulse-switching measurement

Nanoscale, 8, 1383-1389 (2016)