| 18 |
Deok-Yong Cho, Jeong Hwan Kim, Un Ki Kim, Yoon Jang Chung, Jaewon Song, Cheol Seong Hwang, Jae-Min Lee, and Se-Jung Oh Spectroscopic Investigation on the Origin of Photoinduced Carrier Generation in Semiconducting InGaO and InGaZnO Films The Journal of Physical Chemistry C, 27, 114, 11962-11964 (2010) |
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| 17 |
Hyung-Suk Jung, Jung-Min Park, Hyo Kyeom Kim, Jeong Hwan Kim, Seok-Jun Won, Joohwi Lee, Sang Young Lee, Cheol Seong Hwang, Weon-Hong Kim, Min-Woo Song, Nae-In Lee, and Deok-Yong Cho The Bias Temperature Instability Characteristics of In Situ Nitrogen Incorporated ZrOxNy Gate Dielectrics Electrochemical and Solid-State Letters, 9, 13, G71-G74 (2010) |
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| 16 |
Kwang Duk Na, Jeong Hwan Kim, Tae Joo Park, Jaewon Song, Cheol Seong Hwang*, and Jung-Hae Choi* Improved properties of Pt-HfO2 gate insulator-ZnO semiconductor thin film structure by annealing of ZnO layer Thin Solid Films, 18, 518, 5326-5330 (2010) |
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| 15 |
Hyun Ju Lee, Gun Hwan Kim, Min Hyuk Park, An-Quan Jiang, and Cheol Seong Hwang Polarization reversal behavior in the Pt/Pb(Zr,Ti)O3/Pt and Pt/Al2O3/Pb(Zr,Ti)O3/Pt capacitors for different reversal directions Applied Physics Letters, 21, 96, 212902 (2010) |
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| 14 |
Chul-Hee Min, Suyeon Cho, Seung-Hyuk Lee, Deok-Yong Cho, Won Goo Park, Jae Gwan Chung, Eunha Lee, Jae Cheol Lee, Benayad Anass, Jae Hak Lee, Cheol Seong Hwang, and Se-Jung Oh Effect of oxygen partial pressure on the Fermi level of ZnO1-x films fabricated by pulsed laser deposition Applied Physics Letters, 20, 96, 201907 (2010) |
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| 13 |
Seok-Jun Won, Myung Soo Huh, Sanghyun Park, Sungin Suh, Tae Joo Park, Jeong Hwan Kim, Cheol Seong Hwang, and Hyeong Joon Kim Capacitance and interface analysis of transparent analog capacitor using Indium Tin Oxide electrodes and high-k dielectrics Journal of The Electrochemical Society, 7, 157, G170-G175 (2010) |
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| 12 |
Seong Keun Kim, Jeong Hwan Han, Gun Hwan Kim, and Cheol Seong Hwang Investigation on the Growth Initiation of Ru Thin Films by Atomic Layer Deposition Chemistry of Materials, 9, 22, 2850-2856 (2010) |
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| 11 |
Woo Young Park, Gun Hwan Kim, Jun Yeong Seok, Kyung Min Kim, Seul Ji Song,Min Hwan Lee and Cheol Seong Hwang A Pt/TiO2/Ti Schottky-type selection diode for alleviating the sneak current in resistance switching memory arrays Nanotechnology, 21, 195201 (2010) |
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| 10 |
Min Hwan Lee, Kyung Min Kim, Gun Hwan Kim, Jun Yeong Seok, Seul Ji Song, Jung Ho Yoon, and Cheol Seong Hwang Study on the electrical conduction mechanism of bipolar resistive switching TiO2 thin films using impedance spectroscopy Applied Physics Letters, 15, 96, 152909 (2010) |
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| 9 |
Yong Cheol Shin†, Min Hwan Lee†, Kyung Min Kim, Gun Hwan Kim, Seul Ji Song, Jun Yeong Seok, and Cheol Seong Hwang* Bias polarity dependent local electrical conduction in resistive switching TiO2 thin films physica status solidi (RRL) - Rapid Research Letters, 5-6, 4, 112-114 (2010) |
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| 8 |
Hyung-Suk Jung, Hyo Kyeom Kim, Jeong Hwan Kim, Seok-Jun Won, Deok-Yong Cho, Joohwi Lee, Sang Young Lee, Cheol Seong Hwang, Jung-Min Park, Weon-Hong Kim, Min-Woo Song, Nae-In Lee, and Sung Heo Electrical and Bias Temperature Instability Characteristics of n-Type Field-Effect Transistors Using HfOxNy Gate Dielectrics Journal of The Electrochemical Society, 5, 157, G121-G126 (2010) |
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| 7 |
Kyung Min Kim, Seul Ji Song, Gun Hwan Kim, Joon Young Seok, Min Hwan Lee, Jin Shi Zhao, and Cheol Seong Hwang Methods of Set Switching for Improving the Uniformity of Filament Formation in the TiO2 Thin Film Electrochemical and Solid-State Letters, 6, 13, G51-G53 (2010) |
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| 6 |
Seul Ji Song, Kyung Min Kim, Gun Hwan Kim, Min Hwan Lee, Jun Yeong Seok, Ranju Jung and Cheol Seong Hwang Identification of the controlling parameter for the set-state resistance of a TiO2 resistive switching cell Applied Physics Letters, 11, 96, 112904 (2010) |
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| 5 |
Myung Soo Huh, Bong Seob Yang, Seungha Oh, Jeong-hwan Kim, Byung Du Ahn, Je-Hun Lee, Joohan Kim, Jae Kyuong Jeong, Cheol Seong Hwang, and Hyeong Joon Kim Improving the Performance of Tin Oxide Thin-Film Transistors by Using Ultralow Pressure Sputtering Journal of The Electrochemical Society, 4, 157, H425-H429 (2010) |
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| 4 |
Hyung-Suk Jung, Jeong Hwan Kim, Joohwi Lee, Sang Young Lee, Un Ki Kim, Cheol Seong Hwang, Jung-Min Park, Weon-Hong Kim, Min-Woo Song, and Nae-In Lee Bias temperature instability characteristics of n- and p-type field effect transistors using HfO2 gate dielectrics and metal gate Journal of The Electrochemical Society, 3, 157, H355-H360 (2010) |
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| 3 |
Deok-Hwang Kwon, Kyung Min Kim, Jae Hyuck Jang, Jong Myeong Jeon, Min Hwan Lee, Gun Hwan Kim, Xiang-Shu Li, Gyeong-Su Park, Bora Lee, Seungwu Han, Miyoung Kim and Cheol Seong Hwang Atomic structure of conducting nanofilaments in TiO2 resistive switching memory Nature Nanotechnology, 5, 148-153 (2010) |
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| 2 |
Seok-Jun Won, Sungin Suh, Sang Woon Lee, Gyu-Jin Choi, Cheol Seong Hwang, and Hyeong Joon Kim Substrate Dependent Growth Rate of Plasma-Enhanced Atomic Layer Deposition of Titanium Oxide Using N2O Gas Electrochemical and Solid-State Letters, 2, 13, G13-G16 (2010) |
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| 1 |
Kyung Min Kim, Sang Young Lee, Gyu Jin Choi, Jeong Hwan Han and Cheol Seong Hwang Electrically Benign Dry-Etching Method for Rutile TiO2 Thin-Film Capacitors with Ru Electrodes Electrochemical and Solid-State Letters, 1, 13, G1-G4 (2010) |
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