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date : 2004.02.12. (Thu.) time : 14:00 room : °üÇØ seminar room
Presentation for Raman spectroscopy by Ph.D OSWALT Joël Jean
Division Manager of Raman Group JOBIN-YVON SAS Horiba Group France
Abstract Raman and Luminescence spectroscopy are useful techniques for the characterization of semiconductors. The Raman signal is sensitive to internal as well as external perturbations of lattice vibrations. This may affect the position, line width, line shape and intensity of the signal. Examples of such perturbations are symmetry breakdown, lattice disorder, temperature, strain, free carriers, etc. A careful analysis of the Raman spectra can provide information about different material properties related to these perturbations. The luminescence spectrum provides information about emission wavelength, essential for optoelectronic device applications, alloy composition, temperature, stress and quantum yield.
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